What structural length scales can be detected by the spectral variance of a microscope image?
What structural length scales can be detected by the spectral variance of a microscope image?
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DOI：
10.1364/ol.39.004290
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发表时间：
2014-08-01
期刊：
影响因子：
3.6
通讯作者：
Backman, Vadim
中科院分区：
文献类型：
--
作者：
Cherkezyan, Lusik;Subramanian, Hariharan;Backman, Vadim
配置用于检测远区背散射光干涉光谱的光谱显微镜，通过获取的亮场图像的光谱方差(（Sigma) /波浪(2)）量化统计折射率（RI）分布。它对亚衍射尺度下弱散射、无标签介质中细微结构变化的敏感性显示出从材料科学到医学诊断等领域的巨大前景。我们进一步研究（Sigma）在波浪上的长度尺度灵敏度，并揭示，理论上，它可以检测任何空间频率的RI波动。基于5%的噪声底限，（Sigma） over tilde检测范围从22到200-700 nm（确切值取决于样品结构和厚度）。在一个涉及生物细胞核质量密度分布特征的例子中，我们建议染色质组织水平，可以通过波浪上的（Sigma）来量化。(C) 2014年美国光学学会
A spectroscopic microscope, configured to detect interference spectra of backscattered light in the far zone, quantifies the statistics of refractive-index (RI) distribution via the spectral variance ((Sigma) over tilde (2)) of the acquired bright-field image. Its sensitivity to subtle structural changes within weakly scattering, label-free media at subdiffraction scales shows great promise in fields from material science to medical diagnostics. We further investigate the length-scale sensitivity of (Sigma) over tilde and reveal that, in theory, it can detect RI fluctuations at any spatial frequency whatsoever. Based on a 5% noise floor, (Sigma) over tilde detects scales from similar to 22 to 200-700 nm (exact values depend on sample structure and thickness). In an example involving mass-density distribution characteristic of biological cell nuclei, we suggest the level of chromatin organization, which can be quantified via (Sigma) over tilde. (C) 2014 Optical Society of America