QTL for field resistance to late blight in potato are strongly correlated with maturity and vigour
QTL for field resistance to late blight in potato are strongly correlated with maturity and vigour
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DOI：
10.1023/a:1009601427062
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发表时间：
1999-10-01
影响因子：
3.1
通讯作者：
Waugh, R
中科院分区：
文献类型：
--
作者：
Collins, A;Milbourne, D;Waugh, R
田间抗性致病疫霉，叶和块茎枯萎病的病原体在栽培马铃薯，早熟性（成熟度）和活力，进行了检查，在一个二倍体分离的马铃薯种群在重复试验中生长在连续三个生长季节。利用基于PCR的SSR、AFLP和CAPS分子标记构建了该群体的遗传连锁图谱。分析性状分数旁边的标记分离数据允许识别的基因组区域，显着相关的各个字符的组件。所有四个性状的最显着的协会与标记等位基因马铃薯连锁群V起源于男性（易感）的父母。在叶片对晚疫病的抗性的情况下，在先前的[16]和平行研究[21]中已经检测到位于12个马铃薯连锁群中的11个上的大多数效应的位置。缺乏来自茄属植物的对晚疫病过敏反应的R基因以及抗性、活力和早熟性的QTL的共定位表明，发育和/或生理因素在决定该种群的叶子抗性水平方面发挥着重要作用。与以往的研究结果相反，叶部和块茎枯萎病抗性之间呈负相关。
Field resistance to Phytophthora infestans, the causal agent of foliage and tuber blight in cultivated potatoes, earliness (maturity) and vigour, were examined in a diploid segregating potato population grown in replicated trials over three consecutive growing seasons. A genetic linkage map of this population was constructed in parallel using PCR-based SSR, AFLP and CAPS markers. Analysis of the trait scores alongside the marker segregation data allowed the identification of regions of the genome which were significantly correlated with components of the respective characters. The most significant associations for all four traits were with marker alleles on potato linkage group V originating from the male (susceptible) parent. In the case of foliage resistance to late blight, the positions of the majority of the effects, which were located on eleven of the twelve potato linkage groups, have been detected in previous [16] and parallel studies [21]. The absence of Solanum demissum-derived R genes for hypersensitive response to late blight and the co-localisation of QTL for resistance, vigour and earliness suggest that developmental and/or physiological factors play a major role in determining the level of foliage resistance in this population. In contrast with previous findings, a negative correlation was found between foliage and tuber blight resistance.