Beam performance of tracking detectors with industrially produced GEM foils

Beam performance of tracking detectors with industrially produced GEM foils
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DOI：
10.1016/j.nima.2008.09.041
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发表时间：
2008-08
期刊：
Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
影响因子：
1.4
通讯作者：
F. Simon;J. Kelsey;M. Kohl;R. Majka;M. Pleško;T. Sakuma;N. Smirnov;H. Spinka;B. Surrow
F. Simon;J. Kelsey;M. Kohl;R. Majka;M. Pleško;T. Sakuma;N. Smirnov;H. Spinka;B. Surrow
中科院分区：
物理与天体物理3区
文献类型：
--
作者：
F. Simon;J. Kelsey;M. Kohl;R. Majka;M. Pleško;T. Sakuma;N. Smirnov;H. Spinka;B. Surrow

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在费米实验室的介子试验束装置上，对三个有效面积为10 cm × 10 cm、具有二维激光蚀刻正交条读出的气体电子倍增器（GEM）跟踪探测器进行了粒子束实验。这些检测器使用Tech-Etch，Inc.生产的GEM箔。它们的效率超过95%，空间分辨率优于70μm。详细研究了粒子入射角对效率和空间分辨率的影响。
Three Gas-Electron-Multiplier (GEM) tracking detectors with an active area of 10cm×10cm and a two-dimensional, laser-etched orthogonal strip readout have been tested extensively in particle beams at the Meson Test Beam Facility at Fermilab. These detectors used GEM foils produced by Tech-Etch, Inc. They showed an efficiency in excess of 95% and spatial resolution better than 70μm. The influence of the angle of incidence of particles on efficiency and spatial resolution was studied in detail.