Line tension and reduction of apparent contact angle associated with electric double layers
Line tension and reduction of apparent contact angle associated with electric double layers
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DOI：
10.1063/1.4892621
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发表时间：
2014-08
影响因子：
4.6
通讯作者：
Aaron Dorr;S. Hardt
中科院分区：
文献类型：
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作者：
Aaron Dorr;S. Hardt
用解析法和数值法计算了非极性基片上电解质润湿时的线张力。结果表明，根据表观接触角的值，可以获得正或负的线张力值。此外，在远离三相接触线的几个德拜长度处测得的杨氏接触角和表观接触角之间存在显著差异。当将结果应用于水润湿高度带电表面时，可以实现与最近实验中发现的相同数量级的线张力值。因此，提出的理论可能有助于线张力测量的理解，并指出静电线张力的重要性。被强烈依赖于界面电荷密度，静电线张力被发现是可调的通过所涉及的电解质的pH值。作为一个实际的结果，吸附在流体-流体界面的纳米粒子的稳定性预计将被破坏。
The line tension of an electrolyte wetting a non-polar substrate is computed analytically and numerically. The results show that, depending on the value of the apparent contact angle, positive or negative line tension values may be obtained. Furthermore, a significant difference between Young's contact angle and the apparent contact angle measured several Debye lengths remote from the three-phase contact line occurs. When applying the results to water wetting highly charged surfaces, line tension values of the same order of magnitude as found in recent experiments can be achieved. Therefore, the theory presented may contribute to the understanding of line tension measurements and points to the importance of the electrostatic line tension. Being strongly dependent on the interfacial charge density, electrostatic line tension is found to be tunable via the pH value of the involved electrolyte. As a practical consequence, the stability of nanoparticles adsorbed at fluid-fluid interfaces is predicted to be de...