BESIII ETOF upgrade readout electronics commissioning

BESIII ETOF upgrade readout electronics commissioning
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DOI:
10.1088/1674-1137/41/1/016103
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发表时间:
2017-01
期刊:
影响因子:
3.6
通讯作者:
Xiaozhuang Wang;H. Dai;Zhi Wu;Y. Heng;Jie Zhang;P. Cao;X. Ji;Cheng Li;Weijia Sun;
Xiaozhuang Wang;H. Dai;Zhi Wu;Y. Heng;Jie Zhang;P. Cao;X. Ji;Cheng Li;Weijia Sun;
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Xiaozhuang Wang;H. Dai;Zhi Wu;Y. Heng;Jie Zhang;P. Cao;X. Ji;Cheng Li;Weijia Sun;

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北京谱仪III(BESIII)的端盖飞行时间(ETOF)被建议升级为多间隙电阻板室(MRPC),目标是总时间分辨率约为80ps。在完成整个读出电路系统后,对读出电路进行了散热、辐射硬度和大电流束测试等实验,验证了读出电路的可靠性和稳定性。BEPCII E3线上的束流也对读出电子设备进行了探测器上的测试。测试结果表明,读出电子系统达到了设计要求。
It is proposed to upgrade the endcap time-of-flight (ETOF) of the Beijing Spectrometer III (BESIII) with a multi-gap resistive plate chamber (MRPC), aiming at an overall time resolution of about 80 ps. After completing the entire readout electronics system, some experiments, such as heat radiation, radiation hardness and large-current beam tests, have been carried out to confirm the reliability and stability of the readout electronics. An on-detector test of the readout electronics has also been performed with the beam at the BEPCII E3 line. The test results indicate that the readout electronics system fulfills its design requirements.