Calibration of EM simulator on substrate complex permittivity
Calibration of EM simulator on substrate complex permittivity
复制标题
电磁模拟器对基板复介电常数的校准
DOI：
--
复制
发表时间：
2014
期刊：
影响因子：
--
通讯作者：
M. Rutschlin
中科院分区：
文献类型：
--
作者：
V. Sokol;J. Eichler;M. Rutschlin
提出了一种新的宽带非谐振直通线（TL）技术，用于提取衬底的复介电常数，而端部发射连接器的影响被完全抑制。与传统TRL技术的主要区别在于，只需要两个校准标准，并且Thru和Line之间的长度差远大于频带中心频率处波长的四分之一。更大的有效线长度增加了对衬底损耗的灵敏度，并允许在较低频率下进行精确测量。该技术使用测量的传播常数在三维电磁场模拟器的复介电常数提取。这种TL技术已被实验验证微带和接地共面波导传输线使用RO 4350 B基板在45 MHz - 26 GHz的频率范围内。一个环形谐振器耦合到微带线被用作验证DUT。
A novel broadband non-resonant Thru-Line (TL) technique is proposed for the extraction of substrate complex permittivity, while the influence of the end-launch connectors is fully suppressed. The main difference to the traditional TRL techniques is that only two calibration standards are needed and the length difference between Thru and Line is much larger than a quarter of a wavelength at the central frequency of the band. The larger effective line length increases sensitivity to the substrate losses, and allows accurate measurement at lower frequencies. The technique uses the measured propagation constant in a 3D EM field simulator for the complex permittivity extraction. This TL technique has been verified experimentally for microstrip and grounded coplanar waveguide transmission lines using RO4350B substrate in the frequency range 45 MHz - 26 GHz. A ring resonator coupled to microstrip line was used as the verification DUT.