Total-reflection X-ray absorption fine structure on liquid surface ☆
Total-reflection X-ray absorption fine structure on liquid surface ☆
复制标题
液体表面全反射X射线吸收精细结构☆
DOI：
10.1016/j.sab.2004.05.019
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发表时间：
2004
期刊：
影响因子：
--
通讯作者：
H. Tanida
中科院分区：
文献类型：
--
作者：
H. Tanida
发展了一种研究溶液表面的全反射X射线吸收精细结构（TR-XAFS）方法。当TR-XAFS方法应用于全反射条件下的空气-溶液界面时，XAFS方法变得表面敏感。因此，它是可能的，以分析由表面活性剂和单层的金属配合物在溶液表面原位通过电子产率和荧光方法的溶液表面上的离子隔离。
A total-reflection X-ray absorption fine structure (TR-XAFS) method has been developed for studying solution surfaces. When the TR-XAFS method is applied to the air–solution interface under the condition of total reflection, the XAFS method becomes surface sensitive. Consequently, it is possible to analyze the ions segregated on the solution surface by surfactants and the monolayer of metal complexes at the solution surface in situ by the electron-yield and fluorescence methods.