Scanning Electron Microscopy (SEM)
Scanning Electron Microscopy (SEM)
复制标题
扫描电子显微镜 (SEM)
DOI：
10.1007/978-1-4614-5491-5_200231
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发表时间：
2015
期刊：
影响因子：
--
通讯作者：
Srivalli Valipe
中科院分区：
文献类型：
--
作者：
Srivalli Valipe
·成像小至10纳米或更小的特征，比光学显微镜可以看到的小约100倍·成像粗糙表面·对小至2米的微结构特征进行定性和半定量的元素分析·识别晶体化合物并确定小至1米的微结构特征的晶体取向(最近开发的能力--目前尚未广泛使用，但可能会得到广泛应用)
• Imaging of features as small as 10 nm or less, roughly 100 times smaller than can be seen with light microscopes • Imaging of rough surfaces • Qualitative and semi-quantitative elemental analyses on microstructural features as small as 2 m • Identifying crystalline compounds and determining crystallographic orientations of microstructural features as small as 1 m (recently developed capability--not currently widely used, but likely to become so)