Surface roughness response to drilling of Ti-5Al-5Mo-5V-3Cr using Ti-Al-N PVD coated and uncoated WC/Co tools
Surface roughness response to drilling of Ti-5Al-5Mo-5V-3Cr using Ti-Al-N PVD coated and uncoated WC/Co tools
复制标题
使用 Ti-Al-N PVD 涂层和未涂层 WC/Co 刀具钻孔 Ti-5Al-5Mo-5V-3Cr 时的表面粗糙度响应
DOI：
10.1016/j.procir.2020.02.112
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发表时间：
2020
期刊：
影响因子：
--
通讯作者：
M. Jackson
中科院分区：
文献类型：
--
作者：
Alex Graves;S. Norgren;P. Crawforth;M. Jackson
用WC/Co刀具钻削高性能钛合金Ti-5Al-5Mo-5V-3CR(Ti-5553)的表面响应不能假设为与Ti-6Al-4V(Ti-)的表面响应相似。研究了在低切削进给和高速切削条件下，涂层与未涂层WC/Co刀具在Ti-5553上钻孔时的表面粗糙度。加工表面速度对表面粗糙度的影响大于进给速度，高的加工速度导致更高的Ra值和更多的变化。此外，在较低的切割速度下使用涂层刀具会导致较低的平均Ra。在大多数情况下，涂层工具比未涂层工具获得更低的Ra值。这被认为是由于刀具刃口半径的不同以及涂层刀具具有更好的稳定性。观察到所有测试条件和工具的Rmax变化很大，在某些情况下Rmax超过10微米。Alcona和扫描电子显微镜成像确定重新粘着的材料拾取是可能的原因。对于钛-5553的钻削，确定了扭矩和表面粗糙度之间的关系，并建议进一步研究使用扭矩测量作为一种替代方法来量化表面粗糙度，而不需要探头测量或图像分析。
The surface response to drilling of the high performance titanium alloy Ti-5Al-5Mo-5V-3Cr (Ti-5553) with WC/Co tools cannot be assumed to similar to that of Ti-6Al-4V (Ti-64). Comparison of surface roughness for holes drilled in Ti-5553 with Ti-Al-N PVD coated and uncoated WC/Co tools at low and high cutting feed and speed was investigated. Cutting surface speed was shown to have more of an impact on surface roughness than that of feed, with high cutting speeds causing higher and more varied Ra value. In addition using coated tools at lower cutting speeds resulted in a lower average Ra. In most cases, the coated tools achieved lower Ra values compared to the uncoated tools. This is thought to be due to a difference in cutting edge radius and better stability associated with the coated tools. High variance in RMax was observed for all tested conditions and tools, in some cases RMax was above 10 µm. Alicona and SEM imaging identified re-adhered material pickup as the probable cause. A correlation between torque and surface roughness was identified for the drilling of Ti-5553 and further investigation is proposed for using torque measurement as an alternate way of quantifying surface roughness without probe measurement or image analysis.