Increasing the efficiency of laser fault injections using fast gate level reverse engineering
Increasing the efficiency of laser fault injections using fast gate level reverse engineering
复制标题
使用快速门级逆向工程提高激光故障注入的效率
DOI：
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
A. Tria
中科院分区：
文献类型：
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作者：
Franck Courbon;Philippe Loubet;J. Fournier;A. Tria
随着更精确、更复杂和更经济的光源、光学器件和控制电路的出现，激光故障注入技术得到了迅速发展。在本文中，我们展示了一种方法来提高测试覆盖率，并加快分析的基础上，激光故障注入只针对感兴趣的标准单元。我们描述了如何识别有趣的空间位置，由于使用一些化学品沿着与自动扫描电子显微镜图像采集，对齐和处理。使用后者的信息，故障注入具有高的成功率已经获得了对硬件实现的AES模块使用激光束。有了这些工具和方法，我们表明攻击变得更快。
Laser fault injections have been evolving rapidly with the advent of more precise, sophisticated and cost-efficient sources, optics and control circuits. In this paper, we show a methodology to improve the test coverage and to speed up analysis based on laser fault injections by only targeting standard cells of interest. We describe how to identify interesting spatial positions thanks to the use of some chemicals along with an automated Scanning Electron Microscope image acquisition, alignment and processing. Using the latter information, fault injections with a high success rate have been obtained against a hardware implemented AES module using a laser beam. With such tools and methodology, we show that attacks become much faster.