Analysis of the beam halo in negative ion sources by using 3D3V PIC code

Analysis of the beam halo in negative ion sources by using 3D3V PIC code
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使用3D3V PIC代码分析负离子源中的束晕

DOI:
10.1063/1.4932390
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发表时间:
2016
期刊:
Rev. Sci. Instrum.
影响因子:
--
通讯作者:
J. Hiratsuka
J. Hiratsuka
中科院分区:
--
文献类型:
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作者:
K. Miyamoto;S. Nishioka;I. Goto;A. Hatayama;M. Hanada;A. Kojima;J. Hiratsuka

文献摘要

相似文献

采用三维粒子模拟方法研究了负离子束晕形成的物理机制和多级加速栅的热负荷。验证了束晕形成的物理机制:束芯和束晕分别由从弯月面中心和外围引出的负离子组成。负离子提取位置的这种差异导致几何畸变。此外,它表明,第一加速网格和第二加速网格上的热负荷的定量改善相比,为2D PIC模拟结果。
The physical mechanism of the formation of the negative ion beam halo and the heat loads of the multi-stage acceleration grids are investigated with the 3D PIC (particle in cell) simulation. The following physical mechanism of the beam halo formation is verified: The beam core and the halo consist of the negative ions extracted from the center and the periphery of the meniscus, respectively. This difference of negative ion extraction location results in a geometrical aberration. Furthermore, it is shown that the heat loads on the first acceleration grid and the second acceleration grid are quantitatively improved compared with those for the 2D PIC simulation result.