Masami Morooka: "Improvement in Sensitivity for Brief Measurement of Diffusion Profiles of Deep Impurities in Semiconductors Based on an Angle-Lapped Surface"Res. Bull. Fukuoka Inst. Tech.. 31. 43-50 (1998)
Masami Morooka: "Improvement in Sensitivity for Brief Measurement of Diffusion Profiles of Deep Impurities in Semiconductors Based on an Angle-Lapped Surface"Res. Bull. Fukuoka Inst. Tech.. 31. 43-50 (1998)
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Masami Morooka：“基于角度重叠表面的半导体深层杂质扩散剖面的简单测量灵敏度的提高”Res。
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