Quantitative Analysis of Lipids with Argon Gas Cluster Ion Beam Seco ndary Ion Mass Spectrometry

Quantitative Analysis of Lipids with Argon Gas Cluster Ion Beam Seco ndary Ion Mass Spectrometry
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氩气团簇离子束二次离子质谱法定量分析脂质

DOI:
10.1002/sia.5518
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发表时间:
2014
影响因子:
1.7
通讯作者:
T. Aoki and J. Matsuo
T. Aoki and J. Matsuo
中科院分区:
化学4区
文献类型:
--
作者:
M. Fujii;S. Nakagawa;T. Seki;T. Aoki and J. Matsuo

文献摘要

相似文献

氩气团簇离子束(Ar‐GCIB)二次离子质谱(西姆斯)技术由于其“软”溅射机制而具有高的有机大分子二次离子产率,已发展成为分析有机材料的有力工具之一。然而,对于复杂生物样品的实际分析,除了高灵敏度之外,还强烈要求高定量准确度。在这项研究中,一些纯的和复合的脂质样品进行了测量与我们原来配备的Ar-GCIB西姆斯设备的目的是确定该技术的定量准确性。发现Ar-GCIB西姆斯装置的检测限低于0.1%。此外,化学结构相似的有机物之间几乎不存在基质效应。版权所有© 2014约翰威利父子有限公司.
Ar gas cluster ion beam (Ar‐GCIB) SIMS has been developed as one of the powerful tools used for analyzing organic materials because of the high secondary ion yield of large organic molecules due to ‘soft’ sputtering mechanism of this technique. However, for practical analysis of complex biological samples, high quantitative accuracy is strongly required besides high sensitivity. In this study, some pure and compound lipid samples were measured with our originally equipped Ar‐GCIB SIMS apparatus with the aim of determining the quantitative accuracy of this technique. It was found that the detection limit of the Ar‐GCIB SIMS apparatus was lower than 0.1%. In addition, there was almost no matrix effect between the organic substances of similar chemical structures. Copyright © 2014 John Wiley & Sons, Ltd.