New Targets for Diagnostic Test Generation
New Targets for Diagnostic Test Generation
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DOI：
10.1109/tcad.2019.2928971
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发表时间：
2020-10
影响因子：
2.9
通讯作者：
I. Pomeranz
中科院分区：
文献类型：
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作者：
I. Pomeranz
逻辑诊断程序提供关于故障单元中存在的缺陷的信息，作为一组候选故障。为了获得更小且更准确的候选故障集，诊断测试生成过程产生区分故障对的测试集。本文观察到，当故障单元中存在多个缺陷时，即使使用诊断测试集进行逻辑诊断，也会获得大量候选故障集。这表明故障对不能为诊断测试生成提供一组完整的目标。本文分析了在特定的逻辑诊断过程中导致大量候选故障形成的条件，并提出了诊断测试生成的新目标。对基准电路的实验结果表明，通过增加对新目标的诊断测试，可以提高诊断测试集的质量。
A logic diagnosis procedure provides information about the defects that are present in a faulty unit as a set of candidate faults. To obtain smaller, and more accurate, sets of candidate faults, a diagnostic test generation procedure produces a test set that distinguishes fault pairs. This paper observes that large sets of candidate faults are obtained when multiple defects are present in a faulty unit, even if a diagnostic test set is used for logic diagnosis. This points to the possibility that fault pairs do not provide a complete set of targets for diagnostic test generation. This paper analyzes the conditions that cause a large set of candidate faults to be formed under a particular logic diagnosis procedure and suggests new targets for diagnostic test generation. The experimental results for benchmark circuits demonstrate that a diagnostic test set can be improved by adding diagnostic tests for the new targets.