Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins
Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins
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DOI：
10.1002/adma.201004160
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发表时间：
2011-05-10
影响因子：
29.4
通讯作者：
Pardoen, Thomas
中科院分区：
文献类型：
--
作者：
Idrissi, Hosni;Wang, Binjie;Pardoen, Thomas
采用片上纳米力学测试方法对含有共格生长孪晶界的纳米晶Pd薄膜进行了形变研究。测量了大的加工硬化能力。所观察到的行为的起源是解开使用透射电子显微镜，并显示特定的位错和孪晶界相互作用。结果表明，大的强度和延展性的平衡增强在Pd膜的潜力，需要在膜H技术。
Nanocrystalline Pd thin films containing coherent growth twin boundaries are deformed using on-chip nanomechanical testing. A large work-hardening capacity is measured. The origin of the observed behavior is unraveled using transmission electron microscopy and shows specific dislocations and twin boundaries interactions. The results indicate the potential for large strength and ductility balance enhancement in Pd films, as needed in membranes for H technologies.