T.Kimura, H.Shiraki, T.Arano, N.Takatsuka: "A discussion on the Relation between Substrate Impurity Concentration Fluctuation and Saturated Signal Fluctution in the Charge Coupled Device Image Sensors" Jour. of the Institute of Electrical Engineers of Jap
T.Kimura, H.Shiraki, T.Arano, N.Takatsuka: "A discussion on the Relation between Substrate Impurity Concentration Fluctuation and Saturated Signal Fluctution in the Charge Coupled Device Image Sensors" Jour. of the Institute of Electrical Engineers of Jap
复制标题
T.Kimura、H.Shiraki、T.Arano、N.Takatsuka：“电荷耦合器件图像传感器中衬底杂质浓度波动与饱和信号波动之间关系的讨论”Jour。
DOI：
--
复制
发表时间：
--
期刊：
影响因子：
--
通讯作者：
中科院分区：
文献类型：
--
作者：
