Hysteresis behavior of t-stub connections with superelastic shape memory fasteners

Hysteresis behavior of t-stub connections with superelastic shape memory fasteners
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DOI:
10.1016/j.jcsr.2005.11.017
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发表时间:
2006-08-01
影响因子:
4.1
通讯作者:
McCarthy, Emily
McCarthy, Emily
中科院分区:
工程技术2区
文献类型:
--
作者:
Abolmaali, Ali;Treadway, Jason;McCarthy, Emily

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本研究比较了用钢和形状记忆合金(SMA)紧固件连接的T型螺栓节点的耗能特性。研究的初始阶段集中于使用两种不同的热处理温度来优化SMA的超弹性效应。然后对样品进行拉伸测试,以确定相变应力、拉伸强度和断裂应变。此外,还进行了低周疲劳试验,考察了在两种温度下热处理的超弹性SMA的耗能特性。然后对循环后的试件进行拉伸测试,以确定疲劳循环对相变应力、拉伸强度和断裂应变的影响。对力学试验结果进行了分析,确定了具有最小残余应变和最大耗能特性的最佳热处理温度。研究的第二阶段涉及使用钢和SMA双端螺纹杆紧固件的T形头连接测试。利用第一阶段确定的最佳热处理工艺研制了用于T型钢连接试验的形状记忆合金紧固件。利用T形柱节点的试验滞回试验结果,比较了形状记忆合金节点和钢扣件节点的耗能能力。(C)2005爱思唯尔有限公司。保留所有权利。
This study compares the energy dissipative characteristics of bolted t-stub connections using steel and shape memory alloy (SMA) fasteners. The initial phase of the study focused on the optimization of the SMA superelastic effect using two different heat treatment temperatures. The samples were then subjected to tensile testing to determine transformation stress, tensile strength, and fracture strain. In addition, low cycle fatigue tests were conducted to examine the energy dissipative characteristics of these superelastic SMAs heat treated at the two temperatures. The cycled samples were then tensile tested to determine the effect of fatigue cycling on transformation stress, tensile strength, and fracture strain. Results from the mechanical tests were analyzed to determine the preferred heat treatment temperature that resulted in the least residual strain and the largest energy dissipative characteristics. The second phase of the study involved t-stub connection testing using steel and SMA double-ended threaded rod fasteners. The optimum heat treatment determined in the first phase was used to develop the SMA fasteners for the t-stub connection tests. Experimental hysteresis results from the t-stub connection tests were used to compare the energy dissipation capacity of the connections with SMA and steel fasteners. (c) 2005 Elsevier Ltd. All rights reserved.