Quantitative analysis of the X-ray, photoelectron spectra of zirconium and zirconium oxide
Quantitative analysis of the X-ray, photoelectron spectra of zirconium and zirconium oxide
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DOI：
10.1016/j.susc.2004.01.016
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发表时间：
2004-03-10
期刊：
影响因子：
1.9
通讯作者：
Graat, PCJ
中科院分区：
文献类型：
--
作者：
Lyapin, A;Graat, PCJ
提出了一种用于评估 XPS 光谱的程序，可以确定对光谱的内在和外在贡献。它基于 X 射线能量分布、核心级主峰、内在和外在激发的横截面以及仪器展宽的物理真实函数的卷积。通过将材料描述为覆盖有相同材料但不同材料的表面层的块状基板来解释表面效应。激发特性。该程序已应用于纯锆和纯氧化锆的角分辨 Zr 3d 光谱。结果表明，在Zr的情况下，Zr 3d光谱的总本征强度的约28％和在ZrO 2 的情况下，约21％不包含在主峰中。 (C) 2004 Elsevier B.V. 保留所有权利。
A procedure for evaluation of XPS spectra is presented that allows the determination of intrinsic and extrinsic contributions to the spectra. It is based on convolution of physically realistic functions for the X-ray energy distribution, the core-level main peak, the cross sections for intrinsic and extrinsic excitations and instrumental broadening. Surface effects have been accounted for by describing the material as a bulk substrate covered with a surface layer of the same material but with different. excitation properties. The procedure has been applied to angle resolved Zr 3d spectra of pure zirconium and pure zirconium oxide. The results show that in the case of Zr about 28% and in the case of ZrO2 about 21% of the total intrinsic intensity of the Zr 3d spectrum is not contained in the main peak. (C) 2004 Elsevier B.V. All rights reserved.