Design and Numerical Verification of a Gate-Controlled Lateral Thyristor for Low-Light Level Detection
Design and Numerical Verification of a Gate-Controlled Lateral Thyristor for Low-Light Level Detection
复制标题
用于微光检测的门控横向晶闸管的设计和数值验证
DOI:
10.1109/jeds.2021.3114751
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发表时间:
2021
影响因子:
2.3
通讯作者:
Zheyao Wang
中科院分区:
文献类型:
--
作者:
Keyang Sun;Liyang Pan;Dong Wu;Jun Xu;Zheyao Wang
Thyristors operated at switching point are highly sensitive to external physical signals such as light or temperature. However, due to the instability of sensitive switching point, conventional thyristors are commonly used as optical switches and hardly applied for low-light level detection. In this work, a silicon-based gate-controlled lateral thyristor (GC-LT), which takes advantage of high sensitivity at low-light, is studied by numerical simulation. A thyristor photodetector circuit and a novel super-off Reset operation method are also proposed to bias the GC-LT over the switching point quickly and allow the photodetector to be operated in a monotonic dynamic multi-sampling mode to achieve high sensitivity to low-light. Simulation results show that the Reset time can be shortened to <inline-formula> <tex-math notation="LaTeX">$ < 10~\mu \text{s}$ </tex-math></inline-formula> without trigging the GC-LT. The trigger time of the photodetector is sensitive to the optical power density ranging from <inline-formula> <tex-math notation="LaTeX">$1\times 10^{-9}$ </tex-math></inline-formula> to <inline-formula> <tex-math notation="LaTeX">$2.5\times 10^{-6}$ </tex-math></inline-formula> W/cm<sup>2</sup>. Furthermore, the average optical gain is about 8.0-6.3, approximately one order of magnitude higher than that of the Si pinned photodiode.