Characterization of Defects, Quantized Magnetic Flux and Shielding Current Flows in Oxide Superconducting Thin Films at One Time by Scanning SQUID Microscopy
Characterization of Defects, Quantized Magnetic Flux and Shielding Current Flows in Oxide Superconducting Thin Films at One Time by Scanning SQUID Microscopy
复制标题
通过扫描 SQUID 显微镜同时表征氧化物超导薄膜中的缺陷、量子化磁通量和屏蔽电流
DOI：
--
复制
发表时间：
2013
期刊：
影响因子：
--
通讯作者：
Tamio Endo et al
中科院分区：
文献类型：
--
作者：
Shunichi Arisawa;Kazuhiro Endo;Tamio Endo et al
