Fast fitting of multi-exponential decay curves
Fast fitting of multi-exponential decay curves
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DOI：
10.1016/s0030-4018(96)00384-7
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发表时间：
1997-01-15
影响因子：
2.4
通讯作者：
Erdmann, R
中科院分区：
文献类型：
--
作者：
Enderlein, J;Erdmann, R
在荧光衰减时间分辨测量的分析中，经常遇到本质上非线性的拟合问题。有几种标准的非线性最小化方法，但它们都对初始猜测参数非常敏感，并且非常耗时。最近，Sasaki和Masuhara以及独立的Apanasovich和Novikov提出了一种优雅的准线性化多指数拟合问题的方法。在本文中，它将被证明，他们的方法可以通过更好地考虑到测量数据的统计特性来改进。
In the analysis of time-resolved measurements of fluorescence decays, one is usually confronted with the essentially non-linear fitting problems. There are several standard methods for non-linear minimisation, but they are all very sensitive to initial guess parameters and are time-consuming. Recently, Sasaki and Masuhara and independently Apanasovich and Novikov proposed an elegant method of quasi-linearising the problem of multi-exponential fitting. In the present paper it will be shown, that their method can be improved by better taking into account the statistical character of the measured data.