Stress-induced R-MA-MC-T symmetry changes in BiFeO3 films
Stress-induced R-MA-MC-T symmetry changes in BiFeO3 films
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DOI:
10.1103/physrevb.83.144107
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发表时间:
2011-04-14
影响因子:
3.7
通讯作者:
Spaldin, N. A.
中科院分区:
文献类型:
--
作者:
Christen, H. M.;Nam, J. H.;Spaldin, N. A.
Recent reports on epitaxial BiFeO3 films show that the crystal structure changes from nearly rhombohedral ("R like") to nearly tetragonal ("T like") at strains exceeding approximate to-4.5%, with the T-like structure being characterized by a highly enhanced c/a ratio. While both the R-like and the T-like phases are monoclinic, our detailed x-ray diffraction results reveal a symmetry change from M-A and M-C type, respectively, at this R-like-to-T-like transition. Therefore, the ferroelectric polarization is confined to different (pseudocubic) planes in the two phases. By applying additional strain or by modifying the unit-cell volume of the film by substituting Ba for Bi, the monoclinic distortion in the T-like MC phase is reduced, i.e., the system approaches a true tetragonal symmetry. Therefore, in going from bulk to highly strained films, a phase sequence of rhombohedral (R)-to-monoclinic (R-like M-A)-to-monoclinic (T-like M-C)-to-tetragonal (T) is observed. This sequence is otherwise seen only near morphotropic phase boundaries in lead-based solid-solution perovskites (i.e., near a compositionally induced phase instability), where it can be controlled by electric field, temperature, or composition. Our results now show that this evolution can occur in a lead-free, stoichiometric material and can be induced by stress alone.