Digital signal waveform improvement on VLSI packaging including inductances
Digital signal waveform improvement on VLSI packaging including inductances
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VLSI 封装上的数字信号波形改进(包括电感)
DOI:
10.1007/s10015-011-0915-y
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发表时间:
2011
期刊:
影响因子:
--
通讯作者:
and Moritoshi Yasunaga
中科院分区:
文献类型:
--
作者:
Hiroki Shimada;Shohei Akita;Masami Ishiguro;Noriyuki Aibe;Ikuo Yoshihara;and Moritoshi Yasunaga
As the digital signal frequency in printed circuit boards (PCBs) increases, waveform distortion, or the signal integrity (SI) problem, is getting more and more serious. The reason the SI problem is becoming serious is that wires or traces need to be regarded as transmission lines which are sensitive to electric noise. In order to overcome this problem, we have proposed a novel methodology called a segmental transmission line (STL), and have shown its effectiveness using computer simulations and fundamental prototypes. However, in the STL design, the combinatorial explosion problem occurs. To solve this problem, a genetic algorithm (GA) was used to design the STL. In this article, we apply the STL to a bus system that includes inductances, which come from the very-large-scale integration (VLSI) packaging. We evaluated the STL in simulation experiments as well as actual experiments using prototypes, and obtained a maximum improvement ratio of 1.53 in the actual experiment.