Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications
Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications
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介电谐振器作为微波应用高温超导薄膜表征的可能标准
DOI：
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发表时间：
1997
期刊：
影响因子：
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通讯作者：
J. Mazierska
中科院分区：
文献类型：
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作者：
J. Mazierska
从精度、灵敏度和范围的角度分析了几种用于微波表征FITS膜的介质谐振器设计的性能。讨论的设计包括Hakki-Coieman屏蔽型以及蓝宝石、金红石和（ZrSn）TiO 3陶瓷的开放式谐振器。最好的介质谐振器已被证明具有表面电阻测量的不确定性只有两倍的不确定性在theQ因子。灵敏度高，能够测量大范围的表面电阻。因此，介质谐振器技术可以被认为是一个标准的测量高温超导薄膜的表面电阻的无线和PCS通信系统的应用提供了足够的测量程序的theQ 0因子如下。
The performance of several designs of dielectric resonators used for microwave characterization of FITS films has been analyzed from the point of view of accuracy, sensitivity, and range. Designs discussed include Hakki-Coieman shielded types as well as open-ended resonators with sapphire, rutile and (ZrSn)TiO3 dielectrics. The best dielectric resonators have proved to have an uncertainty in surface resistance measurements only twice the uncertainty in theQ-factor. high sensitivity, and ability to measure a wide range of surface resistances. Hence the dielectric resonator technique can be considered as a standard for measurements of surface resistance of HTS films for wireless and PCS communication systems applications provided that adequate measurement procedures of theQ0-factor are followed.