Mechanism of enhanced light emission from an emitting layer embedded in metal-insulator-metal structures
Mechanism of enhanced light emission from an emitting layer embedded in metal-insulator-metal structures
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DOI：
10.1103/physrevb.82.035441
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发表时间：
2010-07-28
影响因子：
3.7
通讯作者：
Fujii, Minoru
中科院分区：
文献类型：
--
作者：
Hayashi, Shinji;Maekawa, Akimichi;Fujii, Minoru
测量位于金属-绝缘体-金属（MIM）结构中间的染料层的光致发光光谱，并将其与没有金属层的参考样品的光致发光光谱进行比较。观察到的光谱比参考样品的光谱更清晰，并且随着观察角度的增加，峰值波长移动到更短的波长。此外，可以清楚地观察到发射强度和功率的增强。基于点偶极子模型的电磁计算表明，观察到的光发射是由辐射表面等离子体激元和 MIM 结构支持的最低阶横向电模式介导的。观察到的增强被认为是由 MIM 结构带来的自发发射率增强和辐射强度集中在相对较窄的波长区域的组合所致。
Photoluminescence spectra of a dye layer placed at the middle of a metal-insulator-metal (MIM) structure are measured and compared with those of a reference sample without metallic layers. The observed spectra are much sharper than those of the reference sample and the peak wavelength shifts to shorter wavelengths as the observation angle increases. Furthermore, the enhancement in both the emission intensity and power is clearly observed. Electromagnetic calculations based on a point dipole model indicate that the observed light emission is mediated by radiative surface-plasmon polaritons and lowest-order transverse electric modes supported by the MIM structure. The observed enhancement is thought to result from a combination of the enhanced spontaneous emission rate and concentration of radiation intensities in a relatively narrow wavelength region brought by the MIM structure.