High-resolution X-ray luminescence extension imaging
High-resolution X-ray luminescence extension imaging
复制标题
高分辨率X射线发光延伸成像
DOI：
10.1038/s41586-021-03251-6
复制
发表时间：
2021-02-18
期刊：
影响因子：
64.8
通讯作者：
Liu, Xiaogang
中科院分区：
文献类型：
--
作者：
Ou, Xiangyu;Qin, Xian;Liu, Xiaogang
目前涉及平板探测器的X射线成像技术难以对三维物体成像，因为在高度弯曲的表面上制造大面积、柔性、硅基光电探测器仍然是一个挑战（1-3）。在这里，我们展示了超长寿命的X射线捕获的平板自由，高分辨率，三维成像使用一系列的解决方案可处理的，镧系元素掺杂的纳米闪烁体。通过缺陷形成和电子结构的量子力学模拟证实，我们的实验表征表明，由于辐射引发的主晶格中的阴离子迁移，被困电子的缓慢跳跃可以诱导超过30天的持续辐射发光。我们进一步展示了X射线发光延伸成像，分辨率大于每毫米20线对，光学存储器长于15天。这些发现通过持久的电子捕获提供了对X射线能量转换机制的深入了解，并提供了一个范式，以激励未来对可穿戴X射线探测器的研究，用于以患者为中心的放射摄影和乳腺摄影，成像引导治疗，高能物理学和放射学深度学习。使用镧系元素掺杂的纳米材料和柔性基板，一种方法，使平板自由，高分辨率，三维成像被证明，并被称为X射线发光延伸成像。
Current X-ray imaging technologies involving flat-panel detectors have difficulty in imaging three-dimensional objects because fabrication of large-area, flexible, silicon-based photodetectors on highly curved surfaces remains a challenge(1-3). Here we demonstrate ultralong-lived X-ray trapping for flat-panel-free, high-resolution, three-dimensional imaging using a series of solution-processable, lanthanide-doped nanoscintillators. Corroborated by quantum mechanical simulations of defect formation and electronic structures, our experimental characterizations reveal that slow hopping of trapped electrons due to radiation-triggered anionic migration in host lattices can induce more than 30 days of persistent radioluminescence. We further demonstrate X-ray luminescence extension imaging with resolution greater than 20 line pairs per millimetre and optical memory longer than 15 days. These findings provide insight into mechanisms underlying X-ray energy conversion through enduring electron trapping and offer a paradigm to motivate future research in wearable X-ray detectors for patient-centred radiography and mammography, imaging-guided therapeutics, high-energy physics and deep learning in radiology. Using lanthanide-doped nanomaterials and flexible substrates, an approach that enables flat-panel-free, high-resolution, three-dimensional imaging is demonstrated and termed X-ray luminescence extension imaging.