AN ANALYTICAL EDGE SPREAD FUNCTION MODEL FOR COMPUTER FITTING AND SUBSEQUENT CALCULATION OF THE LSF AND MTF

AN ANALYTICAL EDGE SPREAD FUNCTION MODEL FOR COMPUTER FITTING AND SUBSEQUENT CALCULATION OF THE LSF AND MTF
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DOI:
10.1118/1.597264
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发表时间:
1994-10-01
期刊:
影响因子:
3.8
通讯作者:
SEIBERT, JA
SEIBERT, JA
中科院分区:
医学3区
文献类型:
--
作者:
BOONE, JM;SEIBERT, JA

文献摘要

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Yen,Giger和Doi的先前工作[Med.太棒了。17,962-966(1990)]证明了对实验测量数据使用解析线扩展函数的计算机拟合对于确定成像系统的预采样调制传递函数是非常有用的。在本报告中,殷等人的工作。扩展为包括边缘扩展函数(ESF)的解析表达式。通过将实验确定的边缘扩展函数数据拟合到分析表达式,归一化线扩展函数(LSF)。归一化调制传递函数(MTF)可以很容易地由四个ESF拟合系数计算出来。在狭缝测量不切实际的情况下,例如在所需的狭缝尺寸变得非常小的非常高分辨率的成像系统中,或者在需要大面积曝光的散射辐射或离焦辐射的传输特性的测量中,从线扩展函数到边缘扩展函数的扩展应该是有价值的。
The previous work of Yin, Giger, and Doi [Med. Phys. 17, 962-966 (1990)] demonstrated that using a computerized fit of an analytic line spread function to experimentally measured data is very useful for determining the presampling modulation transfer function of an imaging system. In this report, the work of Yin et al. is extended to include an analytic expression for the edge spread function (ESF). By fitting experimentally determined edge spread function data to the analytical expression, the normalized line spread function (LSF). and the normalized modulation transfer function (MTF) can be easily calculated from four ESF fit coefficients. The extension from the line spread function to the edge spread function should be valuable in cases where slit measurements are impractical, for example, in very high resolution imaging systems where the required slit dimensions become impractically small, or in measurements of the transfer properties of scattered radiation or off-focus radiation, where large area exposures are necessary.