Quantitative Detection of Shallow Subsurface Defects by Using Mode-Converted Waves in Time-of-Flight Diffraction Technique

Quantitative Detection of Shallow Subsurface Defects by Using Mode-Converted Waves in Time-of-Flight Diffraction Technique
复制标题

利用飞行时间衍射技术中的模式转换波定量检测浅层地下缺陷

DOI:
10.1007/s10921-020-00676-3
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发表时间:
2020-03
影响因子:
2.8
通讯作者:
Lin L.
Lin L.
中科院分区:
材料科学2区
文献类型:
--
作者:
Jin S. J.;Sun X.;Ma T. T.;Ding N.;Lei M. K.;Lin L.

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提出了一种基于模式转换波的超声飞行时间衍射法(TOFD)对浅层缺陷进行定量检测的方法。首先,建立了含浅层缺陷的各向同性模型,分析了模式转换波在TOFD B超图像中的传播路径。根据斯奈尔定律,找出走时最短、幅度最大的模式转换波来计算缺陷深度。随后,引入模式转换波走时对缺陷深度的定量表达式进行了修正,提高了缺陷高度的测量精度。模拟结果表明,碳钢的死区深度从5.5 mm减小到2.4 mm。当裂纹高度大于或等于0.7 mm时,浅层亚表面裂纹的测量误差不超过0.02 mm。最后,利用B超图像中的模式转换波对三个浅层缺陷进行了实验检测。测量高度的定量误差在实际值的8.5%以内,验证了该方法的有效性。该方法适用于厚壁构件浅层亚表面缺陷的定量检测。
An easy-to-implement method based on mode-converted waves was proposed for quantitatively detecting shallow subsurface defects using the ultrasonic time-of-flight diffraction (TOFD) technique. First, an isotropic model with a shallow subsurface defect was established to analyze the ray path of the mode-converted wave in TOFD B-scan image. The mode-converted wave with the shortest travel time and highest amplitude was identified to calculate the flaw depth via Snell's law. Subsequently, the quantitative expression of flaw depth was corrected by introducing the travel time of mode-converted wave, improving the measurement accuracy of the flaw height. Simulated results showed that the depth of the dead zone in carbon steel was reduced from 5.5 to 2.4 mm. The measurement error of shallow subsurface cracks was no more than 0.02 mm when the crack height was greater than or equal to 0.7 mm. Finally, three shallow subsurface defects were experimentally detected with the mode-converted waves in B-scan image. The quantitative errors of the measured heights were within 8.5% of the actual values, verifying the validity of the proposed method. This method is appropriate for the quantitative detection of shallow subsurface defects in thick-walled components.
使用小波变换和图像配准对焊接缺陷进行混合超声 TOFD 成像
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