Quantitative Detection of Shallow Subsurface Defects by Using Mode-Converted Waves in Time-of-Flight Diffraction Technique
Quantitative Detection of Shallow Subsurface Defects by Using Mode-Converted Waves in Time-of-Flight Diffraction Technique
复制标题
利用飞行时间衍射技术中的模式转换波定量检测浅层地下缺陷
DOI:
10.1007/s10921-020-00676-3
复制
发表时间:
2020-03
影响因子:
2.8
通讯作者:
Lin L.
中科院分区:
文献类型:
--
作者:
Jin S. J.;Sun X.;Ma T. T.;Ding N.;Lei M. K.;Lin L.
An easy-to-implement method based on mode-converted waves was proposed for quantitatively detecting shallow subsurface defects using the ultrasonic time-of-flight diffraction (TOFD) technique. First, an isotropic model with a shallow subsurface defect was established to analyze the ray path of the mode-converted wave in TOFD B-scan image. The mode-converted wave with the shortest travel time and highest amplitude was identified to calculate the flaw depth via Snell's law. Subsequently, the quantitative expression of flaw depth was corrected by introducing the travel time of mode-converted wave, improving the measurement accuracy of the flaw height. Simulated results showed that the depth of the dead zone in carbon steel was reduced from 5.5 to 2.4 mm. The measurement error of shallow subsurface cracks was no more than 0.02 mm when the crack height was greater than or equal to 0.7 mm. Finally, three shallow subsurface defects were experimentally detected with the mode-converted waves in B-scan image. The quantitative errors of the measured heights were within 8.5% of the actual values, verifying the validity of the proposed method. This method is appropriate for the quantitative detection of shallow subsurface defects in thick-walled components.
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影响因子:
2.8
作者:
Jia-xu Duan;Lin Luo;Xiao-rong Gao;Jian-ping Peng;Jin-long Li
通讯作者:
Jin-long Li
影响因子:
4.2
作者:
Manjula, K.;Vijayarekha, K.;Venkatraman, B.
通讯作者:
Venkatraman, B.
DOI:
10.17265/2159-5348/2015.05.005
发表时间:
2015
期刊:
--
影响因子:
--
作者:
Mohammad;Taghipour
通讯作者:
Mohammad;Taghipour
DOI:
--
发表时间:
2008
期刊:
--
影响因子:
--
作者:
T. Gang;D. Chi
通讯作者:
T. Gang;D. Chi
DOI:
10.4028/www.scientific.net/kem.270-273.378
发表时间:
2004-08
期刊:
Key Engineering Materials
影响因子:
--
作者:
N. Ido;H. Hatanaka;T. Arakawa;K. Katou;H. Furuta
通讯作者:
N. Ido;H. Hatanaka;T. Arakawa;K. Katou;H. Furuta