Low-temperature annealing of 2D Ti3C2Tx MXene films using electron wind force in ambient conditions
Low-temperature annealing of 2D Ti3C2Tx MXene films using electron wind force in ambient conditions
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DOI：
10.1557/s43578-021-00373-5
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发表时间：
2021-09
影响因子：
2.7
通讯作者：
M. Rasel;Brian C. Wyatt;Maxwell T. Wetherington;B. Anasori;A. Haque
中科院分区：
文献类型：
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作者：
M. Rasel;Brian C. Wyatt;Maxwell T. Wetherington;B. Anasori;A. Haque
二维过渡金属碳化物和氮化物，称为MXenes，是具有独特功能的层状材料，使其适用于储能设备，超级电容器，电磁干扰屏蔽和无线通信等应用。由于它们是湿法加工的，MXene需要退火以提高其导电性。退火的程度在很大程度上取决于温度;然而，较高的温度也会影响所得的相和结构。在这项研究中，我们提出了一个非热退火过程中利用电子风力（EWF）方法在环境条件下。该过程在独立的Ti 3C 2 Tx薄膜上得到了证明，与传统的热退火方法相比，我们在低于120 °C的温度下显示出高达70%的电阻率降低。使用拉曼光谱和非原位和原位X射线衍射分析退火前后的MXene结构。EWF退火后Ti 3C 2 Tx层中的表面终止和片内缺陷改性赋予MXene膜比非退火膜更好的导电性。
Two-dimensional transition metal carbides and nitrides, known as MXenes, are layered materials with unique functionalities which make them suitable for applications such as energy storage devices, supercapacitors, electromagnetic interference shielding, and wireless communications. Since they are wet-processed, MXenes need annealing to improve their electrical conductivity. The extent of annealing highly depends on temperature; however, higher temperatures can also impact the resulting phases and structure. In this study, we present a non-thermal annealing process utilizing an electron wind force (EWF) method in ambient conditions. This process is demonstrated on freestanding Ti3C2Tx films, where we show up to 70% decrease in resistivity at temperatures below 120 °C compared to conventional thermal annealing methods. MXene structures before and after annealing are analyzed using Raman spectroscopy and ex situ and in situ X-ray diffraction. Surface terminations and intra-flake defects modification in Ti3C2Tx layers after EWF annealing impart better electrical conductivity to MXene film than the non-annealed films.