Complex observation in electron microscopy: IV. Reconstruction of complex object wave from conventional and half plane phase plate image pair
Complex observation in electron microscopy: IV. Reconstruction of complex object wave from conventional and half plane phase plate image pair
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DOI：
10.1143/jpsj.73.2713
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发表时间：
2004-10-01
影响因子：
1.7
通讯作者：
Nagayama, K
中科院分区：
文献类型：
--
作者：
Danev, R;Nagayama, K
提出了一种基于一种新的透射电子显微镜成像模式的复杂观测序列的扩展。半平面位相板被用来产生具有类似地形外观的图像，并且具有类似于Zernike相衬透射电子显微镜(ZPC-TEM)图像的调制的光谱调制。光学显微镜中的微分干涉对比(DIC)技术产生了类似的对比。这两种技术的主要区别是半平面相位板图像的光谱调制在一个方向上的不对称性，导致这些图像呈现出类似地形的外观。利用适当解调的半平面位相板图像和常规的瞬变电磁图像，可以数值重建物体波的复杂形式。给出了实验结果，证明了复杂重建方案的成功。
An extension of the Complex Observation series based on a novel imaging mode of the transmission electron microscope (TEM) is presented. A half plane phase plate is used to produce images that exhibit topographic-like appearances and have spectral modulation similar to the modulation of Zernike phase contrast TEM (ZPC-TEM) images. The Differential Interference Contrast (DIC) technique in light microscopy produces a similar contrast. The main difference between the two techniques is the asymmetry in one direction of the spectral modulation of the half plane phase plate images, which causes the topographic-like appearance of these images. The complex form of the object wave can be numerically rebuilt using a properly demodulated half plane phase plate image and a conventional TEM image. Experimental results demonstrating the success of the complex reconstruction scheme are presented.