A high-speed dynamic current sensor for iDD test based on the flipped voltage follower
A high-speed dynamic current sensor for iDD test based on the flipped voltage follower
复制标题
基于翻转电压跟随器的用于iDD测试的高速动态电流传感器
DOI：
10.1109/ssmsd.2003.1190428
复制
发表时间：
2003
期刊：
影响因子：
--
通讯作者：
J. Ramírez
中科院分区：
文献类型：
--
作者：
G. Ducoudray;R. González;J. Ramírez
This paper proposes the use of the flipped voltage follower as a high speed current sensor for iDD current testing. Simulations in 0.18 /spl mu/m CMOS technology, as well as experimental results from a breadboard prototype are provided that verify functionality and the potential for high gain-bandwidth of the proposed circuit.
