Anisotropic elastic-stiffness coefficients of an amorphous Ni-P film
Anisotropic elastic-stiffness coefficients of an amorphous Ni-P film
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DOI:
10.1063/1.1457542
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发表时间:
2002-04-15
影响因子:
3.2
通讯作者:
Higo, Y
中科院分区:
文献类型:
--
作者:
Ogi, H;Shimoike, G;Higo, Y
This study presents a complete set of effective elastic-stiffness coefficients of a Ni80P20 amorphous-alloy thin film deposited on an aluminum-alloy substrate by electroless plating. The film thickness was 12 mum. The electromagnetic-acoustic-resonance method detected resonance frequencies of the triple-layered specimens (film/substrate/film), which enabled us to determine all five independent elastic-stiffness coefficients of the film using known substrate elastic properties. The resulting coefficients were those of a transverse isotropic material. There was strong anisotropy between the in-plane and normal directions; the in-plane Young's modulus is larger than the normal Young's modulus by 34%, for example. The anisotropic coefficients can be interpreted by considering a micromechanics model for local incomplete cohesion (thin ellipsoidal voids) aligned parallel to the film surface. (C) 2002 American Institute of Physics.