A methodology for system-level fault injection based on gate-level faulty behavior
A methodology for system-level fault injection based on gate-level faulty behavior
复制标题
一种基于门级故障行为的系统级故障注入方法
DOI：
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发表时间：
2013
期刊：
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通讯作者：
Y. Savaria
中科院分区：
文献类型：
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作者：
R. Robache;Jean;C. Thibeault;Y. Savaria
本文提出了一种创建高级故障模型库来模拟低级故障注入的方法。本文首次提出了错误行为签名的概念。本文演示了故障行为签名如何允许构建高级模型，例如使用Simulink，以高保真度反映在门级表示的组合电路的故障行为，并从故障列表中任意选择一个故障。结果表明，我们能够以99.93%的相关系数捕获这种行为。
In this paper a methodology for creating a high-level faulty models library for simulating low-level fault injection is proposed. The concept of faulty behavior Signature is first proposed in this work. This paper demonstrates how faulty behavior Signatures allow building high level models, for example using Simulink, that reflect with high fidelity the faulty behavior of a combinational circuit represented at gate-level injected with one fault arbitrarily selected from a fault list. It is shown that we are able to capture this behavior with a correlation coefficient of 99.93%.