TE Plane Wave Diffraction by Window Aperture on a Thick Conducting Wall

TE Plane Wave Diffraction by Window Aperture on a Thick Conducting Wall
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厚传导壁上窗口孔径的 TE 平面波衍射

DOI:
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发表时间:
2020
期刊:
TE Plane Wave Diffraction by WindowProc. of 2020 IEEE International Conference on Advanced Tecnologies for Communications
影响因子:
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通讯作者:
SHIRAI Hiroshi
SHIRAI Hiroshi
中科院分区:
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文献类型:
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作者:
NGUYEN Nam Khanh;SHIRAI Hiroshi

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