Atomic force microscopy observation of the Jahn‐Teller instability in spinel LiMn2O4 embedded in silicon substrates
Atomic force microscopy observation of the Jahn‐Teller instability in spinel LiMn2O4 embedded in silicon substrates
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DOI：
10.1063/1.2730467
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发表时间：
2007-05
期刊：
影响因子：
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通讯作者：
K. Kuriyama;A. Onoue;Y. Yuasa;K. Kushida
中科院分区：
文献类型：
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作者：
K. Kuriyama;A. Onoue;Y. Yuasa;K. Kushida
利用原子力显微镜（AFM）和导电探针对锂离子二次电池正极材料尖晶石LiMn 2 O 4在3.5×3.5 μm2硅衬底上的表面形貌进行了研究。在吸引Li+离子的负偏压下，电流在5.5V突然增加，表明Li+离子向表面移动。随着电流的增加，覆盖整个表面的部分鳞片状晶粒膨胀并变平，表明Li积累层中Mn-eg和O-2 p电子之间的排斥作用诱导了Jahn-Teller相变。
Surface morphology of 3.5×3.5 μm2 area of spinel LiMn2O4 embedded in Si substrates, a typical cathode material for Li ion secondary batteries, is studied using an atomic force microscopy (AFM) with a conductive probe. Under the negative bias voltage to attract Li+ ions, electric current abruptly increases at 5.5 V, indicating Li+ ion movement toward the surface. Increase in current accordingly, part of scale‐shaped grains covering the whole surface expand and flatten, suggesting that the Jahn‐Teller phase transition was induced by the repulsive interaction between the Mn‐eg and O‐2p electrons in Li accumulated layer.