Nanoscale mechanics by tomographic contact resonance atomic force microscopy
Nanoscale mechanics by tomographic contact resonance atomic force microscopy
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DOI:
10.1039/c3nr04981g
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发表时间:
2014-01-01
期刊:
影响因子:
6.7
通讯作者:
Su, Chanmin
中科院分区:
文献类型:
--
作者:
Stan, Gheorghe;Solares, Santiago D.;Su, Chanmin
We report on quantifiable depth-dependent contact resonance AFM (CR-AFM) measurements over polystyrene-polypropylene (PS-PP) blends to detail surface and sub-surface features in terms of elastic modulus and mechanical dissipation. The depth-dependences of the measured parameters were analyzed to generate cross-sectional images of tomographic reconstructions. Through a suitable normalization of the measured contact stiffness and indentation depth, the depth-dependence of the contact stiffness was analyzed by linear fits to obtain the elastic moduli of the materials probed. Besides elastic moduli, the contributions of adhesive forces (short-range versus long-range) to contact on each material were determined without a priori assumptions. The adhesion analysis was complemented by an unambiguous identification of distinct viscous responses during adhesion and in-contact deformation from the dissipated power during indentation.