A SPICE-Oriented Nonexistence Test for DC Solutions of Nonlinear Circuits
A SPICE-Oriented Nonexistence Test for DC Solutions of Nonlinear Circuits
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DOI:
10.1093/ietfec/e90-a.8.1661
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发表时间:
2007-07
期刊:
影响因子:
--
通讯作者:
W. Kuroki;K. Yamamura
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文献类型:
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作者:
W. Kuroki;K. Yamamura
As a powerful computational test for nonexistence of a DC solution of a nonlinear circuit, the LP test is well-known. This test is useful for finding all solutions of nonlinear circuits; it is also useful for verifying the nonexistence of a DC operating point in a given region where operating points should not exist. However, the LP test has not been widely used in practical circuit simulation because the programming is not easy for non-experts or beginners. In this paper, we propose a new LP test that can be easily implemented on SPICE without programming. The proposed test is useful because we can easily check the nonexistence of a solution using SPICE only.