X-Ray Imaging Spectrometer (XIS) on Board Suzaku
X-Ray Imaging Spectrometer (XIS) on Board Suzaku
复制标题
DOI：
10.1093/pasj/59.sp1.s23
复制
发表时间：
2007-01
影响因子：
2.3
通讯作者：
K. Koyama;H. Tsunemi;T. Dotani;M. Bautz;K. Hayashida;T. Tsuru;H. Matsumoto;Y. Ogawara;G. Ricker
中科院分区：
文献类型：
--
作者：
K. Koyama;H. Tsunemi;T. Dotani;M. Bautz;K. Hayashida;T. Tsuru;H. Matsumoto;Y. Ogawara;G. Ricker
XIS是一种X射线成像光谱仪系统，由最先进的电荷耦合器件（CCD）、相机机身和控制电子器件组成，这些器件针对X射线检测进行了优化。四套XIS传感器被放置在朱雀卫星上掠入射嵌套薄箔镜（XRT：X射线望远镜）的焦平面上。其中三个XIS传感器具有前照式CCD，而另一个具有背照式CCD。与XRT相结合，能量范围为0.2- 12 keV，能量分辨率为130 eV（5.9keV），视场为18 ° ×18 °。
The XIS is an X-ray Imaging Spectrometer system, consisting of state-of-the-art charge-coupled devices (CCDs) optimized for X-ray detection, camera bodies, and control electronics. Four sets of XIS sensors are placed at the focal planes of the grazing-incidence, nested thin-foil mirrors (XRT: X-Ray Telescope) onboard the Suzaku satellite. Three of the XIS sensors have front-illuminated CCDs, while the other has a back-illuminated CCD. Coupled with the XRT, the energy range of 0.2–12keV with energy resolution of 130eV at 5.9keV, and a field of view of 18 � ×18 �