Chemical surface modification of graphene oxide by femtosecond laser pulse irradiation in aqueous suspensions
Chemical surface modification of graphene oxide by femtosecond laser pulse irradiation in aqueous suspensions
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DOI：
10.1007/s10853-016-0368-8
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发表时间：
2016
影响因子：
4.5
通讯作者：
Muttaqin;Takahiro Nakamura;Y. Nishina;S. Sato
中科院分区：
文献类型：
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作者：
Muttaqin;Takahiro Nakamura;Y. Nishina;S. Sato
研究了飞秒激光脉冲辐照水悬浮液还原氧化石墨烯的反应。通过改变激光能量密度和照射时间等激光参数，获得了缺陷少、电阻率低的最佳还原氧化石墨烯（rGO）。所制造的rGO样品的特征在于使用几种技术，如X-射线衍射，紫外-可见吸收光谱，拉曼光谱，X-射线光电子能谱，和其他。rGO的XRD图谱显示，碳层之间的面间距显著降低至3.51 μ m，这接近原始石墨的面间距。此外，通过拉曼光谱测量的rGO的D带和G带的强度比比GO的D带和G带的强度比小20%以上，表明sp2畴的增强。还原后的石墨烯表面缺陷和无序碳双键网络相对减少。此外，在最佳条件下，rGO的电阻率显著降低至3.3 Ω·cm。从这些结果来看，飞秒激光可以用作GO还原的合适工具，因为它是获得高度还原的氧化石墨烯的简单、可控和灵活的方法。
Reduction of graphene oxide (GO) by femtosecond laser pulse irradiation of an aqueous suspension was studied. Different laser parameters such as laser fluence and irradiation time were scanned to obtain the optimum reduced graphene oxide (rGO) with fewer defect sites and lower electrical resistivity. The fabricated rGO samples were characterized using several techniques such as X-ray diffraction, UV–Visible absorption spectrometry, Raman spectroscopy, X-ray photoelectron spectroscopy, and others. The XRD profiles of rGO revealed that the interplanar spacing between carbon layers significantly decreased to 3.51 Å, which is close to that of pristine graphite. Furthermore, the intensity ratio ofDandGbands of rGO measured by Raman spectroscopy was more than 20 % smaller than that of GO, indicating the enhancement of sp2domains. It is noted that the defect sites and the disorder carbon double bond networks on the basal graphene plane were relatively decreased after reduction. In addition, the electrical resistivity of rGO significantly decreased to 3.3 Ω·cm under the optimum condition. From these results, femtosecond laser can be used as a suitable tool for GO reduction because it is a simple, controllable, and flexible method for getting highly reduced graphene oxide.