Disorder by design: A data-driven approach to amorphous semiconductors without total-energy functionals
Disorder by design: A data-driven approach to amorphous semiconductors without total-energy functionals
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DOI:
10.1038/s41598-020-64327-3
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发表时间:
2019-12
影响因子:
4.6
通讯作者:
D. Limbu;S. Elliott;R. Atta-Fynn;P. Biswas
中科院分区:
文献类型:
--
作者:
D. Limbu;S. Elliott;R. Atta-Fynn;P. Biswas
X-ray diffraction, Amorphous silicon, Multi-objective optimization, Monte Carlo methods. This paper addresses a difficult inverse problem that involves the reconstruction of a three-dimensional model of tetrahedral amorphous semiconductors via inversion of diffraction data. By posing the material-structure determination as a multiobjective optimization program, it has been shown that the problem can be solved accurately using a few structural constraints, but no total-energy functionals/forces, which describe the local chemistry of amorphous networks. The approach yields highly realistic models of amorphous silicon, with no or only a few coordination defects (≤1%), a narrow bond-angle distribution of width 9–11.5°, and an electronic gap of 0.8–1.4 eV. These data-driven information-based models have been found to produce electronic and vibrational properties ofa-Si that match accurately with experimental data and rival that of the Wooten-Winer-Weaire models. The study confirms the effectiveness of a multiobjective optimization approach to the structural determination of complex materials, and resolves a long-standing dispute concerning the uniqueness of a model of tetrahedral amorphous semiconductors obtained via inversion of diffraction data.