Measuring the thermal boundary resistance of van der Waals contacts using an individual carbon nanotube
Measuring the thermal boundary resistance of van der Waals contacts using an individual carbon nanotube
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DOI：
10.1088/0953-8984/25/2/025301
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发表时间：
2013-01
期刊：
影响因子：
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通讯作者：
J. Hirotani;T. Ikuta;T. Nishiyama;Koji Takahashi
中科院分区：
文献类型：
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作者：
J. Hirotani;T. Ikuta;T. Nishiyama;Koji Takahashi
通过货车德瓦尔斯相互作用的界面热传输定量评估使用单个多壁碳纳米管结合在铂热膜传感器。在纳米管的封闭端或侧壁与铂、金或二氧化硅表面之间的界面处获得每单位接触面积的热边界电阻。当考虑表面粗糙度时，侧壁处的边界热阻与封闭端处的边界热阻一致。一个新的发现是，碳纳米管和固体表面之间的热边界电阻是独立的实验误差范围内的材料，这是不符合传统的声子失配模型，这表明了一个明确的材料依赖性的热边界电阻。我们的数据表明，现有的声子模型不适用时，弱货车范德华力占主导地位的界面。
Interfacial thermal transport via van der Waals interaction is quantitatively evaluated using an individual multi-walled carbon nanotube bonded on a platinum hot-film sensor. The thermal boundary resistance per unit contact area was obtained at the interface between the closed end or sidewall of the nanotube and platinum, gold, or a silicon dioxide surface. When taking into consideration the surface roughness, the thermal boundary resistance at the sidewall is found to coincide with that at the closed end. A new finding is that the thermal boundary resistance between a carbon nanotube and a solid surface is independent of the materials within the experimental errors, which is inconsistent with a traditional phonon mismatch model, which shows a clear material dependence of the thermal boundary resistance. Our data indicate the inapplicability of existing phonon models when weak van der Waals forces are dominant at the interfaces.