Structure, Infrared Reflectivity and Microwave Dielectric Properties of (Na0.5La0.5)MoO4–(Na0.5Bi0.5)MoO4 Ceramics

Structure, Infrared Reflectivity and Microwave Dielectric Properties of (Na0.5La0.5)MoO4–(Na0.5Bi0.5)MoO4 Ceramics
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DOI:
10.1111/jace.14175
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发表时间:
2016-06
影响因子:
3.9
通讯作者:
Wen-Bo Li;Di Zhou;Haihong Xi;L. Pang;X. Yao
Wen-Bo Li;Di Zhou;Haihong Xi;L. Pang;X. Yao
中科院分区:
材料科学2区
文献类型:
--
作者:
Wen-Bo Li;Di Zhou;Haihong Xi;L. Pang;X. Yao

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采用固相反应制备了一系列温度稳定的微波介质陶瓷(1−x)(Na0.5La0.5)MoO4–x(Na0.5Bi0.5)MoO4(0.0≤x≤1.0)。所有样品均可在 580°C–680°C 的温度下良好烧结。研究了陶瓷的烧结行为、相组成、微观结构和微波介电性能。 X射线衍射结果表明形成了四方白钨矿固溶体。微波介电特性表明,介电常数(εr)和谐振频率温度系数(τf)逐渐增大,而品质因数(Q×f)值逐渐减小,x值增大。 0.45(Na0.5La0.5)MoO4–0.55(Na0.5Bi0.5)MoO4陶瓷在640°C下烧结,相对介电常数为23.1,aQ×f值为17 500 GHz(9 GHz时)和接近零的τf值为0.28 ppm/°C。远红外光谱(50-1000 cm−1)研究表明,复杂的介电光谱与测量的微波介电常数和介电损耗非常一致。
A series of temperature‐stable microwave dielectric ceramics, (1−x)(Na0.5La0.5)MoO4–x(Na0.5Bi0.5)MoO4(0.0 ≤x≤ 1.0) were prepared by using solid‐state reaction. All specimens can be well sintered at temperature of 580°C–680°C. Sintering behavior, phase composition, microstructures, and microwave dielectric properties of the ceramics were investigated. X‐ray diffraction results indicated that tetragonal scheelite solid solution was formed. Microwave dielectric properties showed that permittivity (εr) and temperature coefficient of resonant frequency (τf) were increased gradually, while quality factor (Q×f) values were decreased, at thexvalue was increased. The 0.45(Na0.5La0.5)MoO4–0.55(Na0.5Bi0.5)MoO4ceramic sintered at 640°C with a relative permittivity of 23.1, aQ×fvalues of 17 500 GHz (at 9 GHz) and a near zero τfvalue of 0.28 ppm/°C. Far‐infrared spectra (50–1000 cm−1) study showed that complex dielectric spectra were in good agreement with the measured microwave permittivity and dielectric losses.