New Evaluation Method of Evaporated Organic Thin Films by Energy Dispersive X-Ray Diffractometer
New Evaluation Method of Evaporated Organic Thin Films by Energy Dispersive X-Ray Diffractometer
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能量色散X射线衍射仪评价蒸发有机薄膜的新方法
DOI：
10.1143/jjap.26.l1839
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发表时间：
1987
影响因子：
1.5
通讯作者：
K. Matsushige
中科院分区：
文献类型：
--
作者：
T. Horiuchi;K. Fukao;K. Matsushige
开发了一种新方法，可以获得在金等基材上蒸发的有机薄膜的清晰衍射图案。在此方法中，利用基板上的全反射来最有效地收集有机薄膜的衍射 X 射线。使用设置在恒定散射角的纯 Ge 固态探测器检测 X 射线，并使用多通道分析仪进行分析。在玻璃上的金和铜酞菁上蒸发的硬脂酸薄膜证明了该系统的优异性能。
A new method was developed to obtain clear diffraction patterns of organic thin films evaporated on substrates such as Au. In this method, total reflection on substrates was utilized to most efficiently collect the diffracted X-rays from organic thin films. The X-rays were detected with a pure Ge solid-state detector set at a constant scattering angle and analyzed with a multichannel analyzer. Excellent performance of this system was demonstrated for a thin stearic acid film evaporated on Au and Cu-phthalocyanine on glass.