Three-dimensional electron backscattered diffraction analysis of deformation in MgO micropillars
Three-dimensional electron backscattered diffraction analysis of deformation in MgO micropillars
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DOI：
10.1016/j.actamat.2011.08.022
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发表时间：
2011-11-01
期刊：
影响因子：
9.4
通讯作者：
Clegg, W. J.
中科院分区：
文献类型：
--
作者：
Korte, S.;Ritter, M.;Clegg, W. J.
小规模试验被广泛用于研究尺寸对塑性的影响或表征脆性材料的塑性变形，其中裂纹在微观尺度上被抑制。几何约束和实验约束已被证明影响小范围变形，目前正在努力更好地了解这些约束。然而，目前的分析技术往往只在一维或二维上具有高分辨率，阻碍了对整个变形体积的详细分析。在这里，提出了三维电子背散射衍射作为表征高空间分辨率的三维(3-D)形变的一种方法。结果表明，通过对压缩的氧化镁微柱进行重建，然后连续切片和标引，这种三维技术产生了补充穆劳埃衍射或电子显微镜的信息，允许将实验人工制品与塑性分布相关联。此外，很容易检测到标准扫描电子显微镜难以观察到的变形特征，例如，在脆性材料破坏之前，只产生很小的表面痕迹或引入最小的塑性应变。(C)2011 Acta Materialia Inc.由爱思唯尔有限公司出版。保留所有权利。
Small-scale testing is extensively used to study the effects of size on plasticity or characterise plastic deformation of brittle materials, where cracking is suppressed on the microscale. Geometrical and experimental constraints have been shown to affect small-scale deformation and efforts are underway to understand these better. However, current analytical techniques tend to possess high resolution in only one or two dimensions, impeding a detailed analysis of the entire deformed volume. Here electron backscattered diffraction in three dimensions is presented as a way of characterising three-dimensional (3-D) deformation at high spatial resolution. It is shown that, by reconstruction of compressed and then successively sliced and indexed MgO micropillars, this 3-D technique yields information complementary to mu-Laue diffraction or electron microscopy, allowing a correlation of experimental artefacts and the distribution of plasticity. In addition, deformation features which are difficult to visualise by standard scanning electron microscopy are easily detected, for example where only small surface traces are produced or minimal plastic strain can be introduced before failure in brittle materials. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.