Adaptive testing - Cost reduction through test pattern sampling
Adaptive testing - Cost reduction through test pattern sampling
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自适应测试 - 通过测试模式采样降低成本
DOI：
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
P. Nigh
中科院分区：
文献类型：
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作者：
M. Grady;Bradley Pepper;Joshua Patch;Mike Degregorio;P. Nigh
在这篇文章中，我们将介绍两种不同的逻辑测试应用--“测试模式采样”，这两种应用显著提高了IBM的处理器和SOC/ASIC的测试成本。这两种方法的驱动程序和实现完全不同--一种依赖于在晶圆测试时应用的实时分析/优化；另一种基于离线分析，每天更新并在最终测试时进行实时调整。
In this paper, we will present two different applications of “test pattern sampling” for logic testing that have significantly improved test cost for Processors and SOCs/ASICs at IBM. The drivers and implementations for these two methods were completely different - one relying on real-time analysis/optimization applied at wafer test; the other based on off-line analysis with daily updates and real-time adjustments at Final Test.