Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey
Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey
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DOI：
10.1155/2010/670476
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发表时间：
2010
期刊：
影响因子：
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通讯作者：
U. Mehta;K. Dasgupta;N. Devashrayee
中科院分区：
文献类型：
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作者：
U. Mehta;K. Dasgupta;N. Devashrayee
基于运行长度的编码方案对于具有大量IP核的当前一代soc的测试数据压缩非常有效。论文的第一部分介绍了基于行程长度的码的研究概况。任何部分指定的测试数据的数据压缩取决于如何用1和0填充未指定的位。在论文的第二部分，提出了基于运行性质的五种不同的“不关心”比特填充方法来预测基于熵的最大压缩。本文将基于运行长度的各种方案与基于熵界的最大数据压缩限制进行了比较。作者声称的实际压缩也进行了比较。对于各种ISCAS电路，已经表明，当X填充完成考虑0后1的运行以及1后0的运行（即扩展FDR）时，它提供了最大的数据压缩。第三部分表明，当填充不关心位以使长时间运行0和1时，平均测试功率和峰值功率最小。
The run length based coding schemes have been very effective for the test data compression in case of current generation SoCs with a large number of IP cores. The first part of paper presents a survey of the run length based codes. The data compression of any partially specified test data depends upon how the unspecified bits are filled with 1s and 0s. In the second part of the paper, the five different approaches for "don't care" bit filling based on nature of runs are proposed to predict the maximum compression based on entropy. Here the various run length based schemes are compared with maximum data compression limit based on entropy bounds. The actual compressions claimed by the authors are also compared. For various ISCAS circuits, it has been shown that when the X filling is done considering runs of zeros followed by one as well as runs of ones followed by zero (i.e., Extended FDR), it provides the maximum data compression. In third part, it has been shown that the average test power and peak power is minimum when the don't care bits are filled to make the long runs of 0s as well as 1s.