Interscale mixing microscopy: far-field imaging beyond the diffraction limit
Interscale mixing microscopy: far-field imaging beyond the diffraction limit
复制标题
尺度混合显微镜：超越衍射极限的远场成像
DOI：
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
V. Podolskiy
中科院分区：
文献类型：
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作者：
Bo Fan;C. Roberts;N. Olivier;William P. Wardley;S. Inampudi;W. Dickson;A. Zayats;V. Podolskiy
光学显微镜被广泛用于分析材料和结构的性质，识别和分类这些结构，并了解和控制它们对外部刺激的反应。可用应用的范围很大程度上取决于特定显微镜技术提供的分辨率。在这里，我们提出了一个分析描述和实验实现的尺度间混合显微镜，基于衍射的成像技术，能够检测和表征波长/10的对象在远场测量相干和非相干宽带光。这种技术的目的是分析亚波长的对象的基础上的远场测量的对象和有限的衍射光栅产生的干涉。分析多个衍射级的单个测量通常足以确定物体的参数。所提出的形式主义打开了机会，在远场的纳米级物体的光谱。
Optical microscopy is widely used to analyze the properties of materials and structures, to identify and classify these structures, and to understand and control their responses to external stimuli. The extent of available applications is determined largely by the resolution offered by a particular microscopy technique. Here we present an analytic description and an experimental realization of interscale mixing microscopy, a diffraction-based imaging technique that is capable of detecting and characterizing wavelength/10 objects in far-field measurements with both coherent and incoherent broadband light. This technique is aimed at analyzing subwavelength objects based on far-field measurements of the interference created by the objects and a finite diffraction grating. A single measurement, analyzing the multiple diffraction orders, is often sufficient to determine the parameters of the object. The presented formalism opens opportunities for spectroscopy of nanoscale objects in the far field.
DOI：
10.1073/pnas.0406877102
发表时间：
2005-09-13
影响因子：
11.1
作者：
Gustafsson, MGL
通讯作者：
Gustafsson, MGL