Logic State Imaging From FA Techniques for Special Applications to One of the Most Powerful Hardware Security Side-Channel Threats
Logic State Imaging From FA Techniques for Special Applications to One of the Most Powerful Hardware Security Side-Channel Threats
复制标题
逻辑状态成像从特殊应用的 FA 技术到最强大的硬件安全侧通道威胁之一
DOI：
10.1109/ipfa49335.2020.9261000
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发表时间：
2020
期刊：
影响因子：
--
通讯作者：
Jean
中科院分区：
文献类型：
--
作者：
C. Boit;T. Kiyan;Thilo Krachenfels;Jean
开发了微电子调试与故障分析(FA)的非接触式故障隔离(CFI)技术来识别异常。如果不仅可以检测到异常，而且可以检测到常规的逻辑功能，非接触式方法就会打开一条通往硬件安全攻击的道路。检测逻辑状态信息通常比检测异常复杂，因为信号电平通常要小得多。成功的逻辑状态成像(LSI)已经在FA社区发表，使用光子发射(PE)和基于激光的CFI技术的特定衍生品。这项工作研究了如何使用非接触式大规模集成电路技术从安全相关电路中读取敏感数据。通过两个案例研究展示了PE、热激光刺激(TLS)和激光逻辑状态成像(LLSI)读取静态随机存取存储器(SRAM)和电池后备RAM(BBRAM)单元的资格。大规模集成电路通过可能扩展到可见光谱区域，为低电压技术和特征尺寸分辨率提供了前景。因此，未来一些技术世代的安全风险将继续存在。此外，当考虑使用人工智能时，CFI技术可以达到跟踪敏感片上数据的新维度，对安全应用程序产生意想不到的后果
Contactless Fault isolation (CFI) techniques of Microelectronic Debug and Failure Analysis (FA) are developed for the identification of anomalies. If not only anomalies can be detected but also regular logical functionality, the contactless approach opens up a path to hardware security attacks. Logical state information is typically more complicated to detect than anomalies, as the signal level is usually considerably smaller. Successful Logic State Imaging (LSI) has been published in the FA community using specific derivatives of photon emission (PE) and laser-based CFI techniques. This work investigates how the contactless LSI techniques can be used for reading sensitive data out of security-relevant circuitry. The qualification of PE, Thermal Laser Stimulation (TLS), and Laser Logic State Imaging (LLSI) to read out Static Random-Access Memory (SRAM) and battery-backed RAM (BBRAM) cells is demonstrated in two case studies. LLSI offers perspectives for low voltage technologies and feature size resolution by possibly expanding into the visible spectral regime. Therefore, the security risk for some technology generations to come will stay. Furthermore, when considering the use of artificial intelligence, CFI techniques can reach new dimensions of tracking sensitive on-chip data with unimagined consequences for security applications