Development of a scanning tunneling microscope for in situ experiments with a synchrotron radiation hard-X-ray microbeam.
Development of a scanning tunneling microscope for in situ experiments with a synchrotron radiation hard-X-ray microbeam.
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开发用于同步辐射硬 X 射线微束原位实验的扫描隧道显微镜。
DOI：
10.1107/s0909049506001622
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发表时间：
2006
影响因子：
2.5
通讯作者：
M. Aono
中科院分区：
文献类型：
--
作者：
A. Saito;Junpei Maruyama;K. Manabe;K. Kitamoto;Koji Takahashi;K. Takami;M. Yabashi;Yoshihito Tanaka;D. Miwa;M. Ishii;Y. Takagi;M. Akai‐Kasaya;Shik Shin;T. Ishikawa;Y. Kuwahara;M. Aono
研制了一台用于同步辐射硬X射线辐照下原位实验的扫描隧道显微镜。通过研制一套高精度的真空对准系统，实现了扫描隧道显微镜（STM）的原位观察。尽管同步辐射设备的噪声条件和探针尖端周围的辐射负荷，STM图像成功地获得了原子分辨率。通过改变Ge吸收边的入射光子能量，获得了清洁Si（111）表面Ge纳米岛的尖端电流谱。在吸收边处检测到电流修改，空间分辨率为10 nm的量级。
A scanning tunneling microscope dedicated to in situ experiments under the irradiation of highly brilliant hard-X-rays of synchrotron radiation has been developed. In situ scanning tunneling microscopy (STM) observation was enabled by developing an accurate alignment system in ultrahigh vacuum. Despite the noisy conditions of the synchrotron radiation facility and the radiation load around the probe tip, STM images were successfully obtained at atomic resolution. Tip-current spectra were obtained for Ge nano-islands on a clean Si(111) surface by changing the incident photon energy across the Ge absorption edge. A current modification was detected at the absorption edge with a spatial resolution of the order of 10 nm.