High resolution atomic force microscopic imaging of the Si(111)-(7x7) surface: Contribution of short-range force to the images - art. no. 256105
High resolution atomic force microscopic imaging of the Si(111)-(7x7) surface: Contribution of short-range force to the images - art. no. 256105
复制标题
DOI：
10.1103/physrevlett.89.266105
复制
发表时间：
2002-12-23
影响因子：
8.6
通讯作者：
Hasegawa, Y
中科院分区：
文献类型：
--
作者：
Eguchi, T;Hasegawa, Y
用原子力显微镜观察Si（111）-（7 × 7）表面的剩余原子层。通过检测由于针尖和样品表面之间形成的单个化学共价键所产生的力，可以清楚地分辨出层上的单个原子。通过将检测力设置为小值并通过减少由于与悬臂和尖锐探针尖端的小振荡幅度的长程相互作用而产生的背景力，实现了前所未有的高空间分辨率。
Observation of the rest-atom layer of the Si(111)-(7x7) surface is performed by atomic force microscopy. By detecting the force due to the single chemical covalent bond formed between the tip and the sample surface, individual atoms on the layer were clearly resolved. Unprecedented high spatial resolution was achieved by setting the detection force at a small value and by reducing background forces due to the long-range interactions with the small oscillation amplitude of the cantilever and sharp probe tip.